Reliability and degradation mechanisms of high-power diode lasers
- 著者名:
- Jandeleit,J. ( Fraunhofer Institute for Laser Technology )
- Wiedmann,N.
- Loosen,P.
- Poprawe,R.
- 掲載資料名:
- Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3626
- 発行年:
- 1999
- 開始ページ:
- 217
- 終了ページ:
- 221
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819430960 [081943096X]
- 言語:
- 英語
- 請求記号:
- P63600/3626
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |