Building assessment with subpixel accuracy using satellite imagery

Building assessment with subpixel accuracy using satellite imagery

著者名:

Meng,J. ( MacDonald Dettwiler and Associates )
Davenport,M.

掲載資料名:

Visual Data Exploration and Analysis III

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2656

発行年:

1996

開始ページ:

65

終了ページ:

76

出版情報:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420305 [0819420301]

言語:

英語

請求記号:

P63600/2656

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016660
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Visual Data Exploration and Analysis
回次:	1996 : 3rd
会議開催地:	San Jose, CA, USA
会議開催年:	1996.01.31-1996.02.02

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