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Resonance photodetachment of Sn negative ion

著者名:
掲載資料名:
Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4064
発行年:
2000
開始ページ:
97
終了ページ:
104
出版情報:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436993 [0819436992]
言語:
英語
請求記号:
P63600/4064
資料種別:
国際会議録

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