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INFLUENCE OF INTERFACE ROUGHNESS SCATTERING ON ELECTRON MOBILITY IN GaAs-Al0.3Ga0.7As TWO DIMENSIONAL ELECTRON GAS (2DEG) HETEROSTRUCTURES

著者名:
Yang, Bin
Cheng, Yong-Hai
Wang, Zhan-Guo
Liang, Ji-Ben
Liao, Qi-Wei
Lin, Lan-Ying
Zhu, Zhan-Ping
Xu, Bo
Li, Wei
さらに 4 件
掲載資料名:
Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
355
発行年:
1995
開始ページ:
545
出版情報:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992566 [1558992561]
言語:
英語
請求記号:
M23500/355
資料種別:
国際会議録

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