Microsystem design framework based on tool adaptations and library developments
- 著者名:
- Karam,J.-M. ( TIMA-CMP Lab. )
- Courtois,B.
- Rencz,M.
- Poppe,A.
- Szekely,V.
- 掲載資料名:
- Microlithography and Metrology in Micromachining II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2880
- 発行年:
- 1996
- 開始ページ:
- 236
- 終了ページ:
- 245
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422781 [0819422789]
- 言語:
- 英語
- 請求記号:
- P63600/2880
- 資料種別:
- 国際会議録
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SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |