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Photoreflectance spectroscopy for semiconductor structure investigations

著者名:
Misiewicz,J. ( Technical Univ.of Wroclaw )  
掲載資料名:
Metal/Nonmetal Microsystems: Physics, Technology, and Applications
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2780
発行年:
1996
開始ページ:
141
終了ページ:
148
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819421661 [0819421669]
言語:
英語
請求記号:
P63600/2780
資料種別:
国際会議録

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1 国際会議録 Photoreflectance spectroscopy for investigations of semiconductor structures (Invited Paper)

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4 国際会議録 Photoreflectance spectroscopy of metalorganic chemical vapor deposition (MOCVD)-grown GaAs and GaAs/GaAlAs structures

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10 国際会議録 Modulation spectroscopy characterization of InAs/GaInAsP/InP quantum dash laser structures

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