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Microtelemetry techniques for implantable smart sensors

著者名:
Troyk,P.R. ( Illinois Institute of Technology )
Schwan,M.A.K.
DeMichele,G.A.
Loeb,G.E.
Schulman,J.
Strojnik,P.
さらに 1 件
掲載資料名:
Smart structures and materials 1996 : Smart sensing, processing and instrumentation : 26-28 February 1996, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2718
発行年:
1996
巻:
PartB
開始ページ:
492
終了ページ:
501
出版情報:
Bellingham: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819420930 [081942093X]
言語:
英語
請求記号:
P63600/2718
資料種別:
国際会議録

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