Blank Cover Image

Study of Defect Behavior in Ion-Implanted Si Wafers by Slow Positron Annihilation Spectroscopy

著者名:
掲載資料名:
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
シリーズ名:
Materials science forum
シリーズ巻号:
196-201
発行年:
1995
パート:
3
開始ページ:
1165
終了ページ:
1170
出版情報:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497164 [0878497161]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

Fujinami,M., Chilton,N.B.

Trans Tech Publications

Fujinami, M., Miyagoe, T., Sawada, T., Suzuki, R., Ohdaira, T., Akahane, T.

Trans Tech Publications

Kaniava, A., Uedono, A., Uchida, H., Komatsu, A., Okada, S., Itoh, H.

Trans Tech Publications

Fujinami,M.

Trans Tech Publications

Fujii,S., Wei,L., Tanigawa,S.

Trans Tech Publications

Mascher,P., Puff,W., Hahn,S., Cho,K.H., Lee,B.Y.

Trans Tech Publications

Miyagoe, T., Fujinami, M., Sawada, T., Suzuki, R., Ohdaira, T., Akahane, T.

Trans Tech Publications

Chen,Z.Q., Ma,L., Wang,Z., Zhu,J., Hu,X.W., Wang,S.J.

Trans Tech Publications

Barthe, M.-F., Desgardin, P., Henry, L., Corbel, C., Britton, D.T., Kogel, G., Sperr, P., Triftshauser, W., Vicente, P., …

Trans Tech Publications

H.F.M. Mohamed, S. Kuroda, Y. Kobayashi, B. Tavernier, R. Suzuki

Trans Tech Publications

Barthe, M.-F., Desgardin, P., Henry, L., Corbel, C., Britton, D.T., Koegel, G., Sperr, P., Triftshauser, W., Vicente, …

Trans Tech Publications

Chen, Z.Q., Maekawa, M., Sekiguchi, T., Suzuki, R., Kawasuso, A.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12