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Edge-texture wavelet features for automated x-ray inspection

著者名:
掲載資料名:
Wavelet applications IV : 22-24 April 1997, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3078
発行年:
1997
開始ページ:
456
終了ページ:
467
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819424938 [0819424935]
言語:
英語
請求記号:
P63600/3078
資料種別:
国際会議録

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