Coupling between hot-carrier degradation modes of pMOSFETs
- 著者名:
- Janapaty,V. ( Vanderbilt Univ. )
- Bhuva,B.L. ( Vanderbilt Univ. )
- Bui,N. ( Advanced Micro Devices,Inc. )
- Kerns,S.E. ( Vanderbilt Univ. )
- 掲載資料名:
- Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 3216
- 発行年:
- 1997
- 開始ページ:
- 145
- 終了ページ:
- 148
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819426482 [0819426482]
- 言語:
- 英語
- 請求記号:
- P63600/3216
- 資料種別:
- 国際会議録
類似資料:
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8
国際会議録
Enhanced Degradation in P+-Poly PMOSFETs With Oxynitride Gate Dielectrics Under Hot-Hole Injection
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |