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Strain effects in CdTe(111) layers on tilted Si(100) substrate by MBE

著者名:
Kang,T.W. ( Dongguk Univ.(Korea) )
Leem,J.H. ( Dongguk Univ.(Korea) )
Hou,Y.B. ( Dongguk Univ.(Korea) )
Jeon,H.C. ( Dongguk Univ.(Korea) )
Hyun,J.K. ( Dongguk Univ.(Korea) )
Lee,H.Y. ( Dongguk Univ.(Korea) )
Han,M.S. ( Korea Electronics Co.,Ltd. )
Hahn,S.R. ( Korea Electronics Co.,Ltd. )
さらに 3 件
掲載資料名:
Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3287
発行年:
1998
開始ページ:
244
終了ページ:
255
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819427267 [0819427268]
言語:
英語
請求記号:
P63600/3287
資料種別:
国際会議録

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