Micro-Raman characterization of GaN epilayers (Invited Paper)

Micro-Raman characterization of GaN epilayers (Invited Paper)

著者名:

Renucci,M.A. ( Univ.Paul Sabatier (France) )
Demangeot,F. ( Univ.Paul Sabatier (France) )
Frandon,J. ( Univ.Paul Sabatier (France) )

掲載資料名:

International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

3359

発行年:

1998

開始ページ:

310

終了ページ:

316

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819428080 [0819428086]

言語:

英語

請求記号:

P63600/3359

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016446
シリーズID:	PA00000029
会議名:	International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics
回次:	1997
会議開催地:	Kiev, Ukraine
会議開催年:	1997.05.13-1997.05.15

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