1.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Wagner,Mt. ; Dirnstorfer,I. ; Hofmann,D.M. ; Karg,F.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1467-1472,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Hofstaetter,A. ; Meyer,B.K. ; Scharmann,A. ; Baranov,P.G. ; Ilyin,I.V. ; Mokhov,E.N.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.595-598,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings

Conference Proceedings
Stadler,W. ; Meyer,B.K. ; Volm,D. ; Hofmam,D.M. ; Hoffmann,A. ; Wiesmann,D. ; Heitz,R. ; Kurtz,E. ; Hommel,D.
Pub. info.: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.303-306,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 182-184
4.

Conference Proceedings

Conference Proceedings
Volm,D. ; Stadler,W. ; Meyer,B.K. ; Traudt,W. ; Sollner,J. ; Heuken,M. ; Wolf,K. ; Reisinger,T. ; Kurtz,L. ; Hommel,D. ; Hofmann,D.M.
Pub. info.: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.307-310,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 182-184
5.

Conference Proceedings

Conference Proceedings
Topf,M. ; Kriegseis,W. ; Burkhardt,W. ; Dirnstorfer,I. ; Meister,D. ; Meyer,B.K.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1323-1326,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
6.

Conference Proceedings

Conference Proceedings
Heitz,R. ; Thurian,P. ; Loa,I. ; Eckey,L. ; Hoffmann,A. ; Broser,I. ; Pressel,K. ; Meyer,B.K. ; Mokhov,E.N.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.719-724,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
7.

Conference Proceedings

Conference Proceedings
Roos,G. ; Schbner,A. ; Pensl,G. ; Krambrock,K. ; Meyer,B.K. ; Spaeth,J.-M. ; Wagner,J.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.951-956,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
8.

Conference Proceedings

Conference Proceedings
Baeumler,M. ; Meyer,B.K. ; Kaufmann,U. ; Schneider,J.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.797-802,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
9.

Conference Proceedings

Conference Proceedings
Krambrock,K. ; Meyer,B.K. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.863-868,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
10.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Hofstaetter,A. ; Baranov,P.G.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.591-594,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
11.

Conference Proceedings

Conference Proceedings
Thurian,P. ; Kaczmarczyk,G. ; Siegle,H. ; Heitz,R. ; Hoffmann,A. ; Broser,I. ; Meyer,B.K. ; Hoffbauer,R. ; Scherz,U.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1571-1576,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
12.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Pawlik,T. ; Alteheld,P. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.417-422,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
13.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Christmann,P. ; Wimbauer,T. ; Stadler,W. ; Nikolov,A. ; Scharmann,A. ; Hofstatter,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1673-1678,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
14.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Omling,P. ; Emanuelsson,P.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.397-398,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
15.

Conference Proceedings

Conference Proceedings
Stadler,W. ; Meyer,B.K. ; Hofmann,D.M. ; Kowalski,B. ; Emanuelsson,P. ; Omling,P. ; Weigl,E. ; Miiller-Vogt,G. ; Cox,R.T.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.399-404,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
16.

Conference Proceedings

Conference Proceedings
Christmann,P. ; Kreissl,J. ; Hoffmann,D.M. ; Meyer,B.K. ; Schwarz,R. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.779-783,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
17.

Conference Proceedings

Conference Proceedings
Krause-Rehberg,R. ; Polity,A. ; Drost,Th. ; Roos,G. ; Pensl,G. ; Volm,D. ; Meyer,B.K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1099-1104,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
18.

Conference Proceedings

Conference Proceedings
Emanueisson,P. ; Maximov,I. ; Linke,H. ; Omling,P. ; Samuelson,L. ; Meyer,B.K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1541-1546,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
19.

Conference Proceedings

Conference Proceedings
Hofmann,D.M. ; Meyer,B.K. ; Stadle,W. ; Kux,A. ; Petrova-Koch,V. ; Koch,F.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1459-1462,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
20.

Conference Proceedings

Conference Proceedings
Ganichev,S.D. ; Yassievich,I.N. ; Prettl,W. ; Diener,J. ; Meyer,B.K. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1079-1084,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
21.

Conference Proceedings

Conference Proceedings
Omling,P. ; Meyer,B.K.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.713-718,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
22.

Conference Proceedings

Conference Proceedings
Meyer,B.K.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.59-66,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
23.

Conference Proceedings

Conference Proceedings
Meyer,B.K. ; Leib,U. ; Hofstaetter,A. ; Krummel,C. ; Kohl,D.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1473-1478,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263