1.

Conference Proceedings

Conference Proceedings
Karamzadeh,A.M. ; Wong,B.J.F. ; Milner,T.E. ; Wilson,M. ; Liaw,L.-H.L. ; Nelson,J.S.
Pub. info.: Proceedings of lasers in surgery : advanced characterization, therapeutics, and systems IX : 23-24 January 1999, San Jose, California.  pp.243-249,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3590
2.

Conference Proceedings

Conference Proceedings
Mitra,S. ; Wilson,M. ; Kompella,S.
Pub. info.: Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California.  Part 1  pp.256-263,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3338
3.

Conference Proceedings

Conference Proceedings
Wilson,M. ; Mitra,S. ; Roberson,G.H. ; Shieh,Y.-Y.
Pub. info.: Applications of soft computing : 28-29 July 1997, San Diego, California.  pp.195-200,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3165
4.

Conference Proceedings

Conference Proceedings
Wilson,M.
Pub. info.: Proceedings of photochemotherapy : photodynamic therapy and other modalities III : 4-6 September 1997, San Remo, Italy.  pp.68-78,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3191
5.

Conference Proceedings

Conference Proceedings
Wilson,M. ; Lagowski,J. ; Sartchouk,A. ; Jastrzbski,L. ; D'Alnico,J. ; DeBusk,D.K. ; Buczkowski,A.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.373-384,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3895
6.

Conference Proceedings

Conference Proceedings
Wilson,M. ; Mitra,S. ; Krile,T.F.
Pub. info.: Digital image recovery and synthesis IV : 20-21 July 1999, Denver, Colorado.  pp.98-105,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3815
7.

Conference Proceedings

Conference Proceedings
Edelman,P. ; Savchouk,A. ; Wilson,M. ; Jastrzebski,L. ; Lagowski,J.J. ; Nauka,K. ; Ma,S. ; Hoff,A.M. ; DeBusk,D.K.
Pub. info.: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II :23-24 September 1998 Santa Clara, California.  pp.126-136,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3509
8.

Conference Proceedings

Conference Proceedings
Burns,T. ; Wilson,M. ; Pearson,G.J.
Pub. info.: Proceedings of photochemotherapy : photodynamic therapy and other modalities : 14-16 September 1995, Barcelona, Spain.  pp.288-297,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2625
9.

Technical Paper

Technical Paper
Sevant,N. ; Bloor,M. ; Wilson,M.
Pub. info.: 7th AIAA/USAF/NASA/ISSMO Symposium on Multidisciplinary Analysis and Optimization : a collection of technical papers, September 2-4, 1998/St. Louis, Missouri.  pt. 2  pp.1099-1107,  1998.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Symposium on Multidisciplinary Analysis and Optimization
Ser. no.: CP9811
10.

Conference Proceedings

Conference Proceedings
D'Amico,J. ; Jastrzebski,L. ; Wilson,M. ; Savtchouk,A.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.124-135,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884