1.
Conference Proceedings
Kontkiewicz, A. M. ; Lagowski, J. ; Dexter, M. ; Edelman, P.
Pub. info.:
Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A. . pp.439-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
324
2.
Conference Proceedings
Sen, S. ; Hoff, A.M. ; Moradi, B. ; Lagowski, J. ; Jastrzebski, L.
Pub. info.:
Proceedings of the Second Symposium on Thin Film Transistor Technologies . pp.269-278, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-35
3.
Conference Proceedings
Henley, W. ; Ostepenko, S. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
Pub. info.:
Proceedings of the Second Symposium on Thin Film Transistor Technologies . pp.265-268, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-35
4.
Conference Proceedings
Ostapenko, S. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
Pub. info.:
Proceedings of the Second Symposium on Thin Film Transistor Technologies . pp.61-67, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-35