1.

Conference Proceedings
Conference Proceedings
1. STUDIES OF THE EFFECT OF RAPID THERMAL ANNEALING ON THE STRUCTURAL AND ELECTRICAL PROPERTIES OF THE HETEROEPITAXIAL CaF2/CoSi2/Si(111) STRUCTURES
Phillips, Julia M. ; Hensel, J.C. ; Joy, D.C. ; Augustyniak, W.M.
Pub. info.: Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A..  pp.609-614,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 74
2.

Conference Proceedings
Conference Proceedings
2. ELECTRON BEAM INDUCED CURRENT STUDIES OF NICKEL SILICIDE/SILICON SCHOTTKY BARRIER HEIGHTS
Gibson, J.M. ; Joy, D.C. ; Tung, R.T. ; Ellison, J.L. ; Pimentel, C. ; Levi, A.F.J.
Pub. info.: Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.163-170,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 56
3.

Conference Proceedings
Conference Proceedings
3. IDENTIFICATION OF CLEAVAGE PLANES IN AN Al3Ti-BASE ALLOY BY ELECTRON CHANNELING IN THE SEM
George, E.P. ; Porter, W.D. ; Joy, D.C.
Pub. info.: High-Temperature ordered intermetallic alloys III : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A..  pp.311-316,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 133
4.

Conference Proceedings
Conference Proceedings
4. RELATIVE LATTICE PARAMETER MEASUREMENT IN QUATERNARY (InGaAsP) LAYERS ON InP SUBSTRATES USING CONVERGENT BEAM ELECTRON DIFFRACTION
Twigg, M.E. ; Chu, S.N.G. ; Joy, D.C. ; Maher, D.M. ; Macrander, A.T. ; Nakahara, S. ; Chin, A.K.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.147-152,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
5.

Conference Proceedings
Conference Proceedings
5. THREE DIMENSIONAL CHARACTERIZATION OF INTERFACES IN SEMICONDUCTORS BY SCANNING ELECTRON MICROSCOPY
Joy, D.C. ; Maher, D.M. ; Farrow, R.C.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.171-176,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
6.

Conference Proceedings
Conference Proceedings
6. *EXTENDED DEFECTS IN AMORPHIZED AND RAPID THERMALLY ANNEALED SILICON
Maher, D.M. ; Knoell, R.V. ; Ellington, M.B. ; Hull, R. ; Jacobson, D.C. ; Joy, D.C.
Pub. info.: Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.93-106,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 52
7.

Conference Proceedings
Conference Proceedings
7. REDUCED SUBBOUNDARY MISALIGNMENT IN SOl FILMS SCANNED AT LOW VELOCITIES
Pfeiffer, L. ; West, K.W. ; Joy, D.C. ; Gibson, J.M. ; Gelman, A.E.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.29-38,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53
8.

Conference Proceedings
Conference Proceedings
8. TRAPPING OF OXYGEN AT HOMOEPITAXIAL Si/Si INTERFACES GROWTH BY MODULAR BEAM EPITAXY
Hull, R. ; Twigg, M.E. ; Bean, J.C. ; Gibson J.M. ; Joy, D.C.
Pub. info.: Oxygen, carbon, hydrogen, and nitrogen in crystalline silicon : symposium held December 2-5, 1985, Boston, Massachusetts, U.S.A..  pp.317-322,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 59
9.

Conference Proceedings
Conference Proceedings
9. IMPROVING THE STRUCTURAL AND ELECTRICAL PROPERTIES OF EPITAXIAL CaF2 ON Si BY RAPID THERMAL ANNEALING
Phillips, J.M. ; Manger, M.L. ; Pfeiffer, L. ; Joy, D.C. ; Smith III, T.P. ; Augustyniak, W.M. ; West, K.W.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.155-162,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53
10.

Conference Proceedings
Conference Proceedings
10. * THERMAL STRESS DURING ZONE-MELTING-RECRYSTALLIZATION OF SILICON ON INSULATOR FILMS: THE ORIGIN OF SUBBOUNDARIES AND IN-PLANE ORIENTATION OF SOI
Gibson, J.M. ; Pfeiffer, L.N. ; West, K.W. ; Joy, D.C.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.289-300,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53