1.

Conference Proceedings
Conference Proceedings
1. Fabrication and Tensile Properties of Lotus-Type Porous Iron and SUS304L Stainless Steel
Hyun, S.K. ; Ikeda, T. ; Tane, M. ; Nakajima, H.
Pub. info.: Advanced structural and functional materials design : proceedings of the International Symposium on Advanced Structural and Functional Materials Design, Osaka, Japan, November 10th-12th, 2004.  pp.337-342,  2006.  Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 512
2.

Conference Proceedings
Conference Proceedings
2. Nanometer fluctuations of erythrocytes imaged by Hilbert phase microscopy [5864-11]
Popescu, G. ; Ikeda, T. ; Badizadegan, K. ; Dasari, R.R. ; Feld, M.S.
Pub. info.: Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany.  pp.58640B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5864
3.

Conference Proceedings
Conference Proceedings
3. Macroscopic constitutive model of shape memory alloys for partial transformation cycles
Ikeda, T. ; Nae, F.A. ; Matsuzaki, Y.
Pub. info.: Smart structures and materials 2004 : modeling, signal processing, and control : 15-18 March 2004, San Diego, California, USA.  pp.112-121,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5383
4.

Conference Proceedings
Conference Proceedings
4. Direct diode laser cladding of Co-based alloy to dual-phase stainless steel for repairing machinery parts
Yamada, K. ; Morisita, S. ; Kutsuna, M. ; Ikeda, T.
Pub. info.: First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan.  pp.65-70,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4831
5.

Conference Proceedings
Conference Proceedings
5. Fe Tracer Diffusion in L10 Ordered FePt
Nose, Y. ; Ikeda, T. ; Nakajima, H. ; Tanaka, K. ; Numakura, H.
Pub. info.: Defect properties and related phenomena in intermetallic alloys : symposium held December 3-5, 2002, Boston, Massachusetts, U.S.A..  pp.381-386,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 753
6.

Conference Proceedings
Conference Proceedings
6. Modeling of ferroelastic behavior of shape memory alloys
Ikeda, T.
Pub. info.: Smart structures and materials 2005 : Modeling, signal processing, and control : 7-9 March 2005, San Diego, California, USA.  pp.344-352,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5757
7.

Conference Proceedings
Conference Proceedings
7. Supporting Effects of Methylaluminoxane on Propene Polymerization with an Alkyltitanium Complex
Hagimoto, H. ; Shiono, T. ; Ikeda, T.
Pub. info.: Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002.  pp.129-132,  2003.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 145
8.

Conference Proceedings
Conference Proceedings
8. Ultra-High-Speed and Low-Power SOI CMOS Technology with Body-Tied Hybrid Trench Isolation Structure
Hirano, Y. ; Ipposhi, T. ; Thai, D. H. ; Iwamatsu, T. ; Ikeda, T. ; Tsujiuchi, M. ; Maegawa, S. ; Inuishi, M. ; Ohji, Y.
Pub. info.: Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium.  pp.60-64,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-04
9.

Conference Proceedings
Conference Proceedings
9. 02-P-25 - Synthesis of TMA-SOD from a novel type layered silicate by solid state transformation
Kiyozumi, Y. ; Mizukami, F. ; Akiyama, Y. ; Ikeda, T. ; Nishide, T.
Pub. info.: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.191-191,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 135
10.

Conference Proceedings
Conference Proceedings
10. Micromechanical model of polycrystalline shape memory alloys based on Reuss assumption
Ikeda, T. ; Nae, F.A. ; Matsuzaki, Y.
Pub. info.: Smart structures and materials 2003 : Modeling, signal processing, and control :3-6 March 2003, San Diego, California, USA, Ralph C. Smith, chairs/editors ; Sponsored by SPIE--The International Society for Optical Engineering.  pp.35-45,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5049
11.

Conference Proceedings
Conference Proceedings
11. 21-P-18 - Crystal structure and magnetic properties of rubidium clusters in zeolite LTA
Ikeda, T. ; Kodaira, T.
Pub. info.: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.300-300,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 135
12.

Conference Proceedings
Conference Proceedings
12. 22-P-17 - Electronic states and arrangements of AgI and CuI clusters incorporated into zeolite LTA
Kodaira, T. ; Ikeda, T.
Pub. info.: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.362-362,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 135
13.

Conference Proceedings
Conference Proceedings
13. A Rietveld-Analysis Program RIETAN-98 and its Applications to Zeolites
Izumi, F. ; Ikeda, T.
Pub. info.: EPDIC 6 : proceedings of the sixth European Powder Diffraction Conference, held August 22-25, 1998 in Budapest, Hungary.  pp.198-205,  2000.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 321-324(1)
14.

Conference Proceedings
Conference Proceedings
14. MEM-Based Structure-Refinement System REMEDY and its Applications
Izumi, F. ; Kumazawa, S. ; Ikeda, T. ; Hu, W.-Z. ; Yamamoto, A. ; Oikawa, K.
Pub. info.: EPDIC 7 : proceedings of the seventh European Powder Diffraction Conference, held May 20-23, 2000 in Barcelona, Spain.  pp.59-64,  2001.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 378-381
15.

Conference Proceedings
Conference Proceedings
15. Measurement and Analysis of Sound Absorption of Porous Magnesium
Xie, Z.K. ; Ikeda, T. ; Okuda, Y. ; Nakajima, H.
Pub. info.: Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003.  pp.661-664,  2004.  Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 449-452
16.

Conference Proceedings
Conference Proceedings
16. Structural Study of a High Ionic Conductor Rb4Cu16I7.2Cl12.8
Oikawa, K. ; Kamiyama, T. ; Kanno, R. ; Izumi, F. ; Ikeda, T. ; Chakoumakos, B.C.
Pub. info.: EPDIC 8 : proceedings of the eighth European Powder Diffraction Conference, held May 23-26, 2002 in Uppsala, Sweden.  pp.337-340,  2004.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 443-444
17.

Conference Proceedings
Conference Proceedings
17. YAG laser microwelding of stainless steel and shape memory alloy
Uenishi, K. ; Seki, M. ; Kunimasa, T. ; Takatsugu, M. ; Kobayashi, K.F. ; Ikeda, T. ; Tsuboi, A.
Pub. info.: Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan.  pp.57-62,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4830
18.

Conference Proceedings
Conference Proceedings
18. Water-jet-guided laser processing
Richerzhagen, B. ; Kutsuna, M. ; Okada, H. ; Ikeda, T.
Pub. info.: Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan.  pp.91-94,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4830
19.

Technical Paper
Technical Paper
19. Study of Low Viscosity ATF with Extending Gear Fatigue Life.
Fujita, H. ; Takakura, Y. ; Ikeda, T.
Pub. info.: 2007 International Fuels and Lubricants Meeting : SAE technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
20.

Technical Paper
Technical Paper
20. Nonlinear Vibrations in a Parametrically Excited Fluid-structure Interaction System with One-to-one Internal Resonance.
Ikeda, T.
Pub. info.: A.S.M.E. paper.  2003.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : IMECE
Ser. no.: 2003
21.

Technical Paper
Technical Paper
21. Spray and Combustion Characteristics of Reformulate Biodiesel with Mixing of Lower Boiling Point Fuel.
Senda, J. ; Ikeda, T. ; Haibara, T. ; Sakurai, S. ; Wada, Y.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
22.

Technical Paper
Technical Paper
22. Adsorption and Desorption Characteristics of the Adsorber to Control the HC Emission from a Gasoline Engine.
Mukai, K. ; Kanesaka, H. ; Akama, H. ; Ikeda, T.
Pub. info.: 2004 Powertrain and Fluid Systems Conference and Exhibition : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
23.

Technical Paper
Technical Paper
23. Improvement of Transitional Characteristic by Measuring Pressure in the Combustion Chamber.
Ikeda, T. ; Nakajima, T. ; Kawai, D. ; Fukami, Y.
Pub. info.: 2005 Small Engine Technology Conference and Exhibition : SAE technical paper.  2005.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2005
24.

Technical Paper
Technical Paper
24. Development of a Lane Mark Recognition System for a Lane Keeping Assist System.
Mineta, K. ; Unoura, K. ; Ikeda, T.
Pub. info.: 2003 SAE world congress : technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2003
25.

Conference Proceedings
Conference Proceedings
25. A simple formulation for rewritable Bragg holograms with angle and polarization multiplicity (Invited Paper) [6332-28]
Ikeda, T. ; Shishido, A.
Pub. info.: Liquid Crystals X.  pp.63320S-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6332
26.

Conference Proceedings
Conference Proceedings
26. Mask pattern quality assurance based on lithography simulation with fine pixel SEM image [5992-59]
Kariya, M. ; Yamanaka, E. ; tanaka, S. ; Ikeda, T. ; Yamaguchi, S. ; Hashimoto, K. ; Itoh, M. ; Kobayashi, H. ; Kawashima, T. ; Narukawa, S.
Pub. info.: 25th Annual BACUS Symposium on Photomask Technology.  pp.59921M-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5992
27.

Conference Proceedings
Conference Proceedings
27. Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern [5880-03]
Yoshizawa, T. ; Yamamoto, M. ; Ikeda, T.
Pub. info.: Optical Diagnostics.  pp.588003-588003,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5880
28.

Conference Proceedings
Conference Proceedings
28. Thermal modeling of photomask precision baking system [6349-174]
Matsubara, K. ; Kobayashi, M. ; Rack, S. ; Miyazaki, S. ; Ikeda, T.
Pub. info.: Photomask Technology 2006.  pp.63494I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
29.

Conference Proceedings
Conference Proceedings
29. Model-based PPC verification methodology with two dimensional pattern feature extraction
Hashimoto, K. ; Ito, T. ; Ikeda, T. ; Nojima, S. ; Inoue, S.
Pub. info.: Optical Microlithography XVI.  Part Two  pp.1156-1165,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
30.

Conference Proceedings
Conference Proceedings
30. Dynamic holographic polymer dispersed liquid crystals (Invited Paper)
Urbas, A.M. ; Klosterman, J. ; Tondiglia, V. ; Natarajan, L.V. ; Sutherland, R.L. ; Tabirian, N. ; Ikeda, T. ; Bunning, T.J.
Pub. info.: Tuning the Optical Response of Photonic Bandgap Structures.  pp.18-25,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5511
31.

Conference Proceedings
Conference Proceedings
31. Novel methodology of employing scatterometry to assess optical proximity correction test pattern
Asano, M. ; Koike, T. ; Mikami, T. ; Abe, H. ; Ikeda, T. ; Tanaka, S. ; Mimotogi, S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XIX.  pp.9-18,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5752
32.

Conference Proceedings
Conference Proceedings
32. Inline CO metrology with combined use of scatterometry and CO-SEM [6152-69]
Asano, M. ; Ikeda, T. ; Koike, T. ; Abe, H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61521V-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
33.

Conference Proceedings
Conference Proceedings
33. Side-chain liquid-crystalline polymers containing oxadiazole and amine moleties for organic light-emitting diode (Invited Paper) [5936-12]
Kinoshita, M. ; Kawamoto, M. ; Mochizuki, H. ; Nam, Y. ; Ikeda, T.
Pub. info.: Liquid Crystals IX.  pp.59360C-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5936
34.

Conference Proceedings
Conference Proceedings
34. Photoinduced bending of polymer films (Invited Paper) [5947-16]
Ikeda, T. ; Maeda, T. ; Kondo, M. ; Yu, Y.
Pub. info.: Liquid Crystals: Optics and Applications.  pp.59470E-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5947
35.

Conference Proceedings
Conference Proceedings
35. Liquid-crystalline elastomers with photomechanical properties (Invited Paper)
Yu, Y. ; Nakano, M. ; Ikeda, T.
Pub. info.: Liquid Crystals VIII.  pp.1-10,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5518
36.

Conference Proceedings
Conference Proceedings
36. Pattern shape comparison methods using SEM image
Ikeda, T. ; Kotani, T. ; Sato, T. ; Ueno, K. ; Matsuoka, R.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.950-961,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
37.

Conference Proceedings
Conference Proceedings
37. Measurement precision of CD-SEM for 65-nm technology node
Abe, H. ; Motoki, H. ; Ikeda, T. ; Yamazaki, Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.929-939,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
38.

Conference Proceedings
Conference Proceedings
38. Highly efficient formation of holographic gratings in polymer liquid crystals
Okano, K. ; Shishido, A. ; Tsutsumi, O. ; Shiono, T. ; Ikeda, T.
Pub. info.: Liquid Crystals VII.  pp.139-146,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5213
39.

Conference Proceedings
Conference Proceedings
39. A photomask defect evaluation system
Yamanaka, E. ; Kanamitsu, S. ; Hirano, T. ; Tanaka, S. ; Ikeda, T. ; Ikenaga, O. ; Kawashima, T. ; Narukawa, S. ; Kobayashi, H.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.257-264,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446
40.

Conference Proceedings
Conference Proceedings
40. Tolerance-based process proximity correction (PPC) verification methodology
Hashimoto, K. ; Fujise, H. ; Nojima, S. ; Ito, T. ; Ikeda, T.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.471-480,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446
41.

Conference Proceedings
Conference Proceedings
41. Reticle SEM specifications required for lithography simulation [5853-36]
Kariya, M. ; Yamanaka, E. ; Tanaka, S. ; Ikeda, T. ; Yamaguchi, S. ; Itoh, M. ; Kobayashi, H. ; Kawashima, T. ; Narukawa, S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.550-555,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853
42.

Conference Proceedings
Conference Proceedings
42. Fine pixel CD-SEM for measurements of two-dimensional patterns
Yamaguchi, S. ; Itoh, M. ; Ikeda, T. ; Miyano, Y. ; Mitsui, T. ; Amma, M. ; Horikawa, S.
Pub. info.: 23rd Annual BACUS Symposium on Photomask Technology.  pp.607-618,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5256