Hahnlein, M., Prusse, U., Daum, J., Morawsky, V., Kroger, M., Schroder, M., Schnabel, M., Vorlop, K. -D.
Elsevier
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L.C.D. Santos, A.B. Couto, J.T. Matsushima, M.C. Forti, M.R. Baldan, N.G. Ferreira
Materials Research Society
|
Prusse, Ulf, Hahnlein, Marc, Daum, Jorg, Vorlop, Klaus-Dieter
American Institute of Chemical Engineers
|
Lee, D. -K., Kim, S. -C.
Elsevier
|
Prusse, U., Morawsky, V., Dierich, A., Vaccaro, A., Vorlop, K. -D.
Elsevier
|
Westerberg, B., Andersson, B., Kunkel, C., Odenbrand, I.
Elsevier
|
Klein, J., Vorlop, K.-D.
American Chemical Society
|
D. M. Bock, K. Kim, J. Mapar
Society of Photo-optical Instrumentation Engineers
|
Kim, S. -C., Kang, J. -K., Kim, D. -S., Lee, D. -K.
Elsevier
|
Till C. Brüggemann, Frerich J. Keil
American Institute of Chemical Engineers
|
Cathcart, J. M., Bock, R. D.
SPIE - The International Society of Optical Engineering
|
McLarnon, C.R., Mathur, V.K.
American Institute of Chemical Engineers
|