Blank Cover Image

Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation

Author(s):
Publication title:
Silicon carbide and related materials 2007 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2007, Otsu Prince Hotel Covention Hall, Lake Biwa Resort, Otsu, Japan, October 14-19, 2007
Title of ser.:
Materials science forum
Ser. no.:
600-603
Pub. Year:
2009
Pt.:
2
Page(from):
1043
Page(to):
1046
Pages:
4
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

N. Iwamoto, S. Onoda, T. Ohshima, K. Kojima, A. Koizumi

Trans Tech Publications

T. Makino, S. Onoda, N. Hoshino, H. Tsuchida, T. Ohshima

Trans Tech Publications

Ohshima, T., Satoh, T., Oikawa, M., Onoda, S., Hirao, T., Itoh, H.

Trans Tech Publications

T. Ohshima, T. Satoh, M. Oikawa, S. Onoda, S. Hishiki, T. Hirao, T. Kamiya, T. Yokoyama, A. Sakamoto, R. Tanaka, I. …

Trans Tech Publications

T. Makino, N. Iwamoto, S. Onoda, T. Ohshima, K. Kojima

Trans Tech Publications

S. Onoda, N. Iwamoto, M. Murakami, T. Ohshima, T. Hirao

Trans Tech Publications

T. Makino, M. Deki, S. Onoda, N. Hoshino, H. Tsuchida

Trans Tech Publications

S. Onoda, T. Ohshima, T. Hirao, S. Hishiki, N. Iwamoto

Trans Tech Publications

S. Hishiki, N. Iwamoto, T. Ohshima, H. Itoh, K. Kojima

Trans Tech Publications

T. Ohshima, N. Iwamoto, S. Onoda, T. Makino, S. Nozaki

Trans Tech Publications

N. Iwamoto, S. Onoda, N. Fujita, T. Makino, T. Ohshima

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12