1.

Conference Proceedings

Conference Proceedings
Lu, W. ; Boeckl, J. ; Mitchel, W.C. ; Rigueur, J. ; Collins, W.E.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1575-1578,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
2.

Conference Proceedings

Conference Proceedings
Boeckl, J. ; Mitchel, W.C. ; Lu, W. ; Rigueur, J.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1579-1582,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
3.

Conference Proceedings

Conference Proceedings
Lu, W. ; Michel, J.A. ; Lukehart, C.M. ; Collins, W.E. ; Mitchel, W.C.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.863-866,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
4.

Conference Proceedings

Conference Proceedings
Lu, W. ; Landis, G.R. ; Collins, W.E. ; Mitchel, W.C.
Pub. info.: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.899-902,  2006.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 527-529
5.

Conference Proceedings

Conference Proceedings
Mitchel, W.C. ; Boeckl, J. ; Tomlin, D. ; Lu, W. ; Rigueur, J. ; Reynolds, J.
Pub. info.: Quantum Sensing and Nanophotonic Devices II.  pp.77-83,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5732