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Dielectric Properties Dependence on Residual Sodium and Potassium Content in Silica Xerogels

Author(s):
Publication title:
Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
411
Pub. Year:
1996
Page(from):
217
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993143 [1558993142]
Language:
English
Call no.:
M23500/411
Type:
Conference Proceedings

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