Blank Cover Image

Defect Formation During Deposition of Undoped a-Si:H by PECVD

Author(s):
Publication title:
Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
420
Pub. Year:
1996
Page(from):
569
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558993235 [1558993231]
Language:
English
Call no.:
M23500/420
Type:
Conference Proceedings

Similar Items:

Maeda, K., Kuroe, A., Umezu, I.

MRS - Materials Research Society

Niiyama, T., Nozaki, H.

Materials Research Society

Johnson, N.M., Wolff, S.H., Doland, C.D., Walker, J.

Materials Research Society

Sugimura, Akira, Ohnishi, Kazuhiro, Tadamasa, Itushi, Umezu, Ikurou

Materials Research Society

Umezu, I., Kuwamura, T., Maeda, K.

MRS - Materials Research Society

Inada, Mitsuru, Ohnishi, Kazuhiro, Umezu, Ikurou, Vaccaro, Pablo O., Sugimura, Akira

Materials Research Society

Inada, Mitsuru, Umezu, Ikurou, Tanaka, Shukichi, Mashiko, Shinro, Sugimura, Akira

Materials Research Society

Wang, J.-T., Zhang, K.-Y., Cao, C.-B., Wang, H.

Electrochemical Society

Schumm, G., Bauer, G. H.

Materials Research Society

Chanana,R.K., Upadhyay,H.N., Dwivedi,R., Srivastava,S.K.

SPIE-The International Society for Optical Engineering, Narosa

Robertson, J., Powell, M. J.

MRS - Materials Research Society

Goerlitzer, M., Pipoz, P., Beck, H., Wyrsch, N., Shah, A. V.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12