1.

Conference Proceedings

Conference Proceedings
Ishimaru, T. ; Matsuura, S. ; Seki, M. ; Fujii, K. ; Koizumi, R. ; Hakataya, Y. ; Moriya, A.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.576-586,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
2.

Conference Proceedings

Conference Proceedings
Itakura, Y. ; Kawasa, Y. ; Wakabayashi, O. ; Moriya, M. ; Nagai, S. ; Sumitani, A. ; Hagiwara, T. ; Ishimaru, T. ; Tsuji, S. ; Fujii, K. ; Wakamiya, W.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.587-598,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
3.

Conference Proceedings

Conference Proceedings
Kaneko, T. ; Hashimoto, Y. ; Ono, K. ; Fujii, K. ; Onisawa, K.
Pub. info.: Thin Film Transistor Technologies V : proceedings of the International Symposium.  pp.160-168,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-31
4.

Conference Proceedings

Conference Proceedings
Shimamura, T. ; Morimura, H. ; Unno, H. ; Fujii, K. ; Shigematsu, S. ; Machida, K. ; Kyuragi, H.
Pub. info.: Design, characterization, and packaging for MEMS and microelectronics II : 17-19 December, 2001, Adelaide, Australia.  pp.23-30,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4593
5.

Conference Proceedings

Conference Proceedings
Hamada, Y. ; Sato, K. ; Morimoto, M. ; Fujii, K.
Pub. info.: ICO20 : display devices and systems : 21-26 August, 2005, Changchun, China.  pp.603005-603005,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6030
6.

Conference Proceedings

Conference Proceedings
Sato, K. ; Sugita, A ; Morimoto, M. ; Fujii, K.
Pub. info.: ICO20 : display devices and systems : 21-26 August, 2005, Changchun, China.  pp.603004-603004,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6030
7.

Conference Proceedings

Conference Proceedings
Hamada, M. ; Sato, K. ; Morimoto, M. ; Fujii, K.
Pub. info.: ICO20 : display devices and systems : 21-26 August, 2005, Changchun, China.  pp.603006-603006,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6030
8.

Conference Proceedings

Conference Proceedings
Wang, J. ; Watanabe, M. ; Goto, Y. ; Fujii, K. ; Kuriaki, H. ; Satoh, M. ; Ikeda, J. ; Fujimoto, K.
Pub. info.: First International Symposium on High-Power Laser Macroprocessing : 27-31 May 2002, Osaka, Japan.  pp.26-31,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4831
9.

Conference Proceedings

Conference Proceedings
Nomura, K. ; Fujii, K.
Pub. info.: Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002.  pp.121-124,  2003.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 145
10.

Conference Proceedings

Conference Proceedings
Fujii, K. ; Yamaguchi, M. ; Ohyama, N. ; Mukai, K.
Pub. info.: Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA.  Part Three  pp.1516-1523,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4684