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Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA. pp.432-440, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Infrared imaging systems: design, analysis, modeling, and testing XV : 14-15 April 2004, Oriando, Florida, USA. pp.189-200, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.52-59, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Materials for infrared detectors and sources : symposium held December 1-5, 1986, Boston, Massachusetts, U.S.A.. pp.81-90, 1987. Pittsburgh, Pa.. Materials Research Society
Durand, A. ; de Borniol, E. ; Vinciguerra, R. ; Cathala, T. ; Yon, J. J. ; Castelein, P. ; Tronel, R. ; Destefanis, G. L.
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Electro-optical and infrared systems : technology and applications : 25-27 October 2004, London, United Kingdom. pp.304-314, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Castelein, P. ; Marion, F. ; Martin, J.-L. ; Baylet, J. ; Moussy, N. ; Gravrand, O. ; Durand, A. ; Chamonal, J.-P. ; Destefanis, G.
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Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France. pp.65-72, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Optical design and engineering : 30 September-3 October 2003, St. Etienne, France. pp.433-440, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering