1.

Conference Proceedings

Conference Proceedings
Lin,C.-H. ; Brown,G.J. ; Mitchel,W.C. ; Ahoujja,M. ; Szmulowicz,F.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.22-29,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
2.

Conference Proceedings

Conference Proceedings
Razeghi,M. ; Saxler,A. ; Kung,P. ; Walker,D. ; Zhang,X. ; Kim,K.S. ; Vydyanath,H.R. ; Solomon,J. ; Ahoujja,M. ; Mitchel,W.C.
Pub. info.: Physics of - Semiconductor Devices -.  Part 1  pp.277-284,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
3.

Conference Proceedings

Conference Proceedings
Mohseni,H. ; Tahraoui,A. ; Wojkowski,J.S. ; Razeghi,M. ; Mitchel,W.C. ; Saxler,A.W.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.145-152,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
4.

Conference Proceedings

Conference Proceedings
Mohseni,H. ; Wojkowski,J.S. ; Tahraoui,A. ; Razeghi,M. ; Brown,G.J. ; Mitchel,W.C.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.153-160,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
5.

Conference Proceedings

Conference Proceedings
Sanchez,E.K. ; Heydemann,V.D. ; Rohrer,G.S. ; Skowronski,M. ; Solomon,J. ; Capano,M.A. ; Mitchel,W.C.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.433-436,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
6.

Conference Proceedings

Conference Proceedings
Evwaraye,A.O. ; Smith,S.R. ; Mitchel,W.C. ; Hobgood,H.McD. ; Augustine,G. ; Balakrishna,V.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.691-696,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings

Conference Proceedings
Smith,S.R. ; Evwaraye,A.O. ; Mitchel,W.C.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.569-572,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
8.

Conference Proceedings

Conference Proceedings
Mitchel,W.C. ; Perrin,R. ; Goldstein,J. ; Roth,M. ; Ahoujja,M. ; Smith,S.R. ; Evwaraye,A.O. ; Solomon,J.S. ; Landis,G. ; Jenny,J. ; Hobgood,H.McD. ; Augustine,G. ; Balakrishna,V.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.545-548,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
9.

Conference Proceedings

Conference Proceedings
Zhou,W. ; Khlebnikov,I. ; Sudarshan,T.S. ; Capano,M.A. ; Mitchel,W.C.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.525-528,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
10.

Conference Proceedings

Conference Proceedings
Saxier,A. ; Kung,P. ; Zhang,X. ; Walker,D. ; Soiomon,J. ; Ahoujja,M. ; Mitchel,W.C. ; Vydyanath,H.R. ; Razeghi,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1161-1166,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263