1.

Conference Proceedings
Conference Proceedings
1. Furnace oxynitridation in nitric oxide of thin silicon oxide: Atomic transport mechanisms and interfacial microstructure
Trimaille, I. ; Ganem, J-J. ; Gosset, L. G. ; Bailly, O. ; Rigo, S. ; Cantin, J-L. ; Bardeleben, H. J. von
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.269-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
2.

Conference Proceedings
Conference Proceedings
2. Degradation of intersubband transitions in electron irradiated GaAs/AlGaAs multiple quantum wells with superlattice barriers
Morath, C. P. ; Manasreh, M. O. ; Gingrich, H. S. ; Bardeleben, H. J. von ; Ballet, P. ; Smathers, J. B. ; Salamo, G. J.
Pub. info.: Infrared applications of semiconductors III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.503-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 607
3.

Conference Proceedings
Conference Proceedings
3. Electrical and Physical Behavior of SiC Layers on Insulator (SiCOI)
Hugonnard-Bruyere, E. ; Letertre, F. ; Cioccio, L. Di ; Bardeleben, H. J. von ; Cantin, J. L. ; Ouisse, T. ; Billon, T. ; Guillot, G.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.715-718,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
4.

Conference Proceedings
Conference Proceedings
4. Modification of the Oxide/Semiconductor Interface by High Temperature NO Treatments: A Combined EPR, NRA and XPS Study on Oxidized Porous and Bulk n-Type 4H-SiC
Bardeleben, H. J. von ; Cantin, J. L. ; Vickridge, I. ; Song, Y. ; Dhar, S. ; Feldman, L. C. ; Williams, J. R. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.277-282,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
5.

Conference Proceedings
Conference Proceedings
5. RBS-Channeling and EPR Studies of Damage in 2 MeV Al2+_Implanted 6H-SiC Substrates
Morilla, Y. ; Garcia Lopez, J. ; Battistig, G. ; Cantin, J. L. ; Cheang-Wong, J. C. ; Bardeleben, H. J. von ; Respaldiza, M. A.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.291-294,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
6.

Conference Proceedings
Conference Proceedings
6. Interface Defects in n-Type 3C-SiC/SiO2: An EPR Study of Oxidized Porous Silicon Carbide Single Crystals
Bardeleben, H. J. von ; Cantin, J. L. ; Ke, L. ; Shishkin, Y. ; Devaty, R. P. ; Choyke, W. J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.273-276,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
7.

Conference Proceedings
Conference Proceedings
7. Native Defects in Low Temperature GaAs and the Effect of Hydrogenation
Pritchard, R. E. ; McQuaid, S. A. ; Newman, R. C. ; Makinen, J. ; Bardeleben, H. J. von ; Missous, M.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.441-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378