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17 results

Conference Proceedings

1. Preparation and properties of perdeuterated polystyrene films

Zhang, L. ; Du, K. ; Zhang, H. ; Tu, H.

Pub. info.:	ECLIM 2002 : 27th European Conference on Laser Interaction with Matter : 7-11 October 2002, Moscow, Russia. pp.745-749, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5228

Conference Proceedings

2. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY

Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.906-911, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

3. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY

Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.906-911, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

4. GROWTH TECHNOLOGY FOR 200mm ANTIMONY HEAVILY DOPED SILICON SINGLE CRYSTALS

Zhou, Q. ; Qin, F. ; Zhou, J. ; Fang, F. ; Wang, J. ; Tu, H.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.307-310, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

5. STUDY ON GEOMETRY, SURFACE DAMAGE AND RAPID THERMAL ANNEALING OF 300mm AS-CUT SILICON WAFERS

Zhang, G. ; Liu, B. ; Zhao, J. ; Chen, W. ; Wang, J. ; Zhou, Q. ; Tu, H.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.189-193, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

6. INVITED: CHINA'S SEMICONDUCTOR INDUSTRY AND THE GLOBAL IC ENVIRONMENT

Tu, H.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.97-110, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

7. GROWTH OF 300mm SILICON SINGLE CRYSTALS IN A 24' HOT ZONE

Tu, H. ; Daj, X. ; Wu, Z. ; Zhang, G. ; Wang, J. ; Fang, F. ; Zhou, Q. ; Xiao, Q.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.182-188, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

8. Numerical simulation of elastic anisotropy in nematic liquid crystalline polymers

Tu, H. ; Goldbeck-Wood, G. ; Windle, A.H.

Pub. info.:	Defects in liquid crystals : computer simulations, theory, and experiments. pp.201-228, 2001. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	43

Conference Proceedings

9. Dynamics of Two-Dimensional Semiconducter Nanoparticle Aggregates and Heterojunctions

Kelley, D. F. ; Tu, H. ; Yang, S. ; Mogyorosi, K.

Pub. info.:	Electron transfer in nanomaterials : proceedings of the International Symposium. pp.286-300, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2004-22

10.

Conference Proceedings

10. STUDY ON GEOMETRY, SURFACE DAMAGE AND RAPID THERMAL ANNEALING OF 300mm AS-CUT SILICON WAFERS

Zhang, G. ; Liu, B. ; Zhao, J. ; Chen, W. ; Wang, J. ; Zhou, Q. ; Tu, H.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.189-193, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

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