1.

Conference Proceedings

Conference Proceedings
Tsubouchi, N. ; Horino, Y. ; Enders, B. ; Chayahara, A. ; Kinomura, A. ; Fujii, K.
Pub. info.: Atomistic mechanisms in beam synthesis and irradiation of materials : symposium held December 1-2, 1997, Boston, Massachusetts, U.S.A..  pp.307-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 504
2.

Conference Proceedings

Conference Proceedings
Tsubouchi, N. ; Horino, Y. ; Enders, B. ; Chayahara, A. ; Kinomura, A. ; Fujii, K.
Pub. info.: Materials modification and synthesis by ion beam processing : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.605-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 438
3.

Conference Proceedings

Conference Proceedings
Tsubouchi, N. ; Chayahara, A. ; Mokuno, Y. ; Kinomura, A. ; Horino, Y.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.363-366,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
4.

Conference Proceedings

Conference Proceedings
Tsubouchi, N. ; Chayahara, A. ; Mokuno, Y. ; Kinomura, A. ; Horino, Y.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.363-366,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
5.

Conference Proceedings

Conference Proceedings
Ishikawa, T. ; Ueno, M. ; Kimata, M. ; Seto, T. ; Tsubouchi, N.
Pub. info.: Infrared Technology and Applications XXVIII.  Part One  pp.254-260,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4820