1.

Conference Proceedings
Conference Proceedings
1. Germanium-on-Insulator (GeOI) Structure Realized by the Smart CutTM Technology
Letertre, F. ; Deguet, C. ; Richtarch, C. ; Faure, B. ; Hartmann, J.M. ; Chieu, F. ; Beaumont, A. ; Dechamp, J. ; Morales, C. ; Allibert, F. ; Perreau, P. ; Pocas, S. ; Personnic, S. ; Lagahe-Blanchard, C. ; Ghyselen, B. ; Vaillant, Y.M.Le ; Jalaguier, E. ; Kernevez, N. ; Mazure, C.
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.153-160,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
2.

Conference Proceedings
Conference Proceedings
2. Detection of Airgiow Lines from EURD
Morales, C. ; Gomez, J.F. ; Trapero, J. ; Moreno, J.J. Lopez ; Bowyer, S. ; Edelstein, J. ; Lampton, M. ; Covell, F.
Pub. info.: Ultraviolet astrophysics beyond the IUE final archive : proceedings of the conference held in Sevilla, Spain, from 11th to 14th November 1997.  pp.837-840,  1998.  Noordwijk, the Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 413
3.

Conference Proceedings
Conference Proceedings
3. X-Ray Characterization of Bonding Interfaces
Rieutord, F. ; Moriceau, H. ; Bataillou, B. ; Morales, C. ; Eymery J.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.338-345,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
4.

Conference Proceedings
Conference Proceedings
4. 200 mm Germanium-on-Insulator (GeOI) Structures Realized from Epitaxial Wafers using the Smart CutTM Technology
Deguet, C. ; Dechamp, J. ; Morales, C. ; Charvet, A.M. ; Clavelier, L. ; Loup V. ; Hartmann, J.M. ; Kernevez, N. ; Campidelli, Y. ; Allibert, F. ; Richtarche, C. ; Akatsu, T. ; Letertre, F.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.78-88,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
5.

Conference Proceedings
Conference Proceedings
5. Surface Plasma Activation Before Direct Wafer Bonding: A Short Review and Recent Results
Moriceau, H. ; Rieutord, F. ; Morales, C. ; Sartori, S. ; Charvet, A.M.(Invited)
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.34-49,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
6.

Conference Proceedings
Conference Proceedings
6. Overview on Some Recent Advances in Wafer Bonding Technologies
Moriceau, H. ; Fournel, F. ; Rayssac, O. ; Cartier, A.M. ; Morales, C. ; Pocas, S. ; Zussy, M. ; Jalaguier, E. ; Biasse, B. ; Bataillou, B. ; Papon, A.M. ; Lagahe, C. ; Aspar, B. ; Maleville, C. ; Leterte, F. ; Ghyselen, B. ; Barge, T.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.1-16,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-27
7.

Conference Proceedings
Conference Proceedings
7. Interest of a Short Plasma Treatment to achieve High Quality Si-SiO2-Si Bonded Structures
Moriceau, H. ; Bataillou, B. ; Morales, C. ; Cartier, A.M. ; Rieutord, F.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.110-117,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-19
8.

Conference Proceedings
Conference Proceedings
8. 0-B Stars in the FUV Range from EURD Onboard Minisat 01
Morales, C. ; Trapero, J. ; Gemez, J.F. ; Gomez, A. ; Bowyer, S. ; Edelstein, J. ; Lampton, M. ; Korpela, E.
Pub. info.: Ultraviolet astrophysics beyond the IUE final archive : proceedings of the conference held in Sevilla, Spain, from 11th to 14th November 1997.  pp.257-260,  1998.  Noordwijk, the Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 413
9.

Conference Proceedings
Conference Proceedings
9. Determination of lithography process control metrics by spectroscopic scatterometry
Maiken, E.B. ; Raghavendra, G. ; Morales, C. ; Choo, B.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.1168-1177,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038