Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.220-226, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices IV : 27-29 January 1999, San Jose, California. pp.371-380, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.227-232, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXVI : 30 July - 3 August 2000, San Diego, USA. pp.335-347, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.163-170, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA. pp.141-150, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1643-1652, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1637-1642, 1997. Zurich, Switzerland. Trans Tech Publications
In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared. pp.243-253, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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