Characterization of resist flow process for the improvement of contact hole CD uniformity
- Author(s):
- Koh, C.-W. ( Hynix Semiconductor, Inc. (South Korea) )
- Lee, D.-H. ( Hynix Semiconductor, Inc. (South Korea) )
- Kim, M.-S. ( Hynix Semiconductor, Inc. (South Korea) )
- Park, S.-N. ( Hynix Semiconductor, Inc. (South Korea) )
- Kwon, W.-T. ( Hynix Semiconductor, Inc. (South Korea) )
- Publication title:
- Advances in Resist Technology and Processing XX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5039
- Pub. Year:
- 2003
- Vol.:
- 2
- Pt.:
- Poster Session
- Page(from):
- 1382
- Page(to):
- 1389
- Pages:
- 8
- Pub. info.:
- Bellingham, CA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448446 [0819448443]
- Language:
- English
- Call no.:
- P63600/5039
- Type:
- Conference Proceedings
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