1.

Conference Proceedings
Conference Proceedings
1. Spatial Characterization of Doped SiC Wafers by Raman Spectroscopy
Burton, J.C. ; Sun, L. ; Pophristic, M. ; Lukacs, S. ; Cohen, S. ; Long, F.H. ; Liang, S. ; Lu, Y. ; Feng, Z.C. ; Li, Y. ; Tran, C.
Pub. info.: Proceedings of the Second Symposium on III-V Nitride Materials and Processes.  pp.220-227,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-34
2.

Conference Proceedings
Conference Proceedings
2. Reduction of Threading Dislocation Density In AlGaN by Indium Incorporation
Kang, H. ; Feng, Z.C. ; Ferguson, I. ; Guo, S.F. ; Pophristic, M.
Pub. info.: GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.335-340,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 798
3.

Conference Proceedings
Conference Proceedings
3. X-ray Diffraction Analysis of GaN and AlGaN
Kang, H. ; Spencer, N. ; Nicol, D. ; Feng, Z.C. ; Ferguson, I. ; Guo, S.P. ; Pophristic, M. ; Peres, B.
Pub. info.: GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A..  pp.405-410,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 743