1.

Conference Proceedings
Conference Proceedings
1. Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods
Szilagyi, E. ; Khanh, N.Q. ; Horvath, Z.E. ; Lohner, T. ; Battistig, G. ; Zolnai, Z. ; Kotai, E. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.271-274,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
2.

Conference Proceedings
Conference Proceedings
2. Ion Beam Analysis and Computer Simulation of Damage Accumulation in Nitrogen Implanted 6H-SiC: Effects of Channeling
Zolnai, Z. ; Ster, A. ; Khanh, N. Q. ; Kotai, E. ; Posselt, M. ; Battistig, G. ; Lohner, T. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.637-640,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
3.

Conference Proceedings
Conference Proceedings
3. Damage Distributions Induced by Channeling Implantation of Nitrogen into 6H Silicon Carbide
Zolnai, Z. ; Khanh, N.Q. ; Lohner, T. ; Ster, A. ; Kotai, E. ; Vickridge, I. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.645-648,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436