The amendment of the removal function model in edge effect [6149-109]

Author(s):

• Shang, W. ( National Univ. Of Defense Technology (China) )
• Dai, Y. ( Xi’an Univ. of Technology (China) )
• Zhou, X. ( Xi’an Univ. of Technology (China) )

Publication title:

2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6149

Pub. Year:

2006

Page(from):

614931

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461889 [0819461881]

Language:

English

Call no.:

P63600/6149

Type:

Conference Proceedings