Analysis of the tunnel junction current

Analysis of the tunnel junction current

Author(s):

Guo, R. ( Xidian Univ. (China) )
Zhao, Z. ( Xidian Univ. (China) )
Lu, M. ( Hebei Semiconductor Research Institute (China) )

Publication title:

Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5774

Pub. Year:

2004

Page(from):

551

Page(to):

554

Pages:

4

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457554 [0819457558]

Language:

English

Call no.:

P63600/5774

Type:

Conference Proceedings

Details

TDL ID:	ZA00015002
Series ID:	PA00000029
Conf. info. (Name):	International Conference on Thin Film Physics and Applications
Conf. info. (Number):	2004 : 5th
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2004.05.31-2004.06.02

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