Calibration results for the AXAF flight contamination monitor
- Author(s):
Elsner, R.F. ( NASA Marshall Space Flight Center ) O'Dell, S.L. Ramsey, B.D. Tennant, A.F. Weisskopf, M.C. Kolodziejczak, J.J. Swartz, D.A. Engelhaupt, D.E. Garmire, G.P. Nousek, J.A. Bautz, M.W. Gaetz, T.J. Zhao, P. - Publication title:
- X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3444
- Pub. Year:
- 1998
- Page(from):
- 177
- Page(to):
- 188
- Pub. info.:
- Bellingham, Wash.: SPIE
- ISSN:
- 0277786X
- ISBN:
- 9780819428998 [081942899X]
- Language:
- English
- Call no.:
- P63600/3444
- Type:
- Conference Proceedings
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