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Calibration results for the AXAF flight contamination monitor

Author(s):
Elsner, R.F. ( NASA Marshall Space Flight Center )
O'Dell, S.L.
Ramsey, B.D.
Tennant, A.F.
Weisskopf, M.C.
Kolodziejczak, J.J.
Swartz, D.A.
Engelhaupt, D.E.
Garmire, G.P.
Nousek, J.A.
Bautz, M.W.
Gaetz, T.J.
Zhao, P.
8 more
Publication title:
X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3444
Pub. Year:
1998
Page(from):
177
Page(to):
188
Pub. info.:
Bellingham, Wash.: SPIE
ISSN:
0277786X
ISBN:
9780819428998 [081942899X]
Language:
English
Call no.:
P63600/3444
Type:
Conference Proceedings

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