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A method of aberration measurement and correction for entire ICF beam path

Author(s):
  • M. Ao ( Institute of Optics and Electronics, China )
  • P. Yang ( Institute of Optics and Electronics, China )
  • Z. Yang ( Institute of Optics and Electronics, China )
  • E. Li ( Institute of Optics and Electronics, China )
  • C. Rao ( Institute of Optics and Electronics, China )
Publication title:
High-power lasers and applications IV : 12-14 November 2007, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6823
Pub. Year:
2008
Page(from):
68230I-1
Page(to):
68230I-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469984 [081946998X]
Language:
English
Call no.:
P63600/6823
Type:
Conference Proceedings

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