Blank Cover Image

500-mm-aperture wavelength-tuning phase-shifting interferometer [5856-98]

Author(s):
Publication title:
Optical Measurement Systems for Industrial Inspection IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5856
Pub. Year:
2005
Pt.:
2
Page(from):
589
Page(to):
596
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458568 [0819458562]
Language:
English
Call no.:
P63600/5856
Type:
Conference Proceedings

Similar Items:

Chai, L., Xu, Q., Deng, Y., Cheng, G., Xu, J., Shi, Q.

SPIE - The International Society of Optical Engineering

L. Nie, J. Han, X. Yu, B. Liu, X. Jiang

Society of Photo-optical Instrumentation Engineers

Gu,Y., Xu,Q., Cai,L.

SPIE-The International Society for Optical Engineering

He, Y., Chen, L., Wang, Q., Chen, J.B.

SPIE-The International Society for Optical Engineering

Deck,I I., Soobitsky,J.A.

SPIE - The International Society for Optical Engineering

J. Chu, Q. Wang, J. P. Lehan, G. Gao, U. Griesmann

Society of Photo-optical Instrumentation Engineers

J. Xu, Q. Xu, L. Chai, Y. Deng

Society of Photo-optical Instrumentation Engineers

Vasisht,G., Boden,A.F., Colavita,M.M., Crawford,S.L., Shao,M., Swanson,P.N., van Belle,G.T., Wallace,J.K., Walker,J.M., …

SPIE-The International Society for Optical Engineering

Xu, J., Sheng, G., Chai L, Xu Q, Deng Y

SPIE - The International Society of Optical Engineering

Chen,J., Chen,L., Huang,S., Jin,G.

SPIE-The International Society for Optical Engineering

Yu, Y., Zhang, B., Jiao, Y.

SPIE - The International Society of Optical Engineering

Gao, Z., Zhu, R., Chen, L., Wang, Q., He, Y., Ji, H.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12