Self-referenced Hartmann testing: radical slope testing

Self-referenced Hartmann testing: radical slope testing

Author(s):

Su, P. ( Beijing Institute of Technology (China) )
Yu, Y.
Zhu, Q.D.
Cao, G.

Publication title:

Adaptive optics and and applications II : 15-16 October 2002 Shanghai, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4926

Pub. Year:

2002

Page(from):

140

Page(to):

145

Pages:

6

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447159 [0819447153]

Language:

English

Call no.:

P63600/4926

Type:

Conference Proceedings

Details

TDL ID:	ZA00012775
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Adaptive Optics and Applications
Conf. info. (Number):	2002 : 2nd
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2002.10.15-2002.10.16

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