Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.173-176, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Arai, T. ; Uchida, T. ; Fukuda, N. ; Yoshida, Y. ; Maekawa, T.
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Fifth International Symposium on Laser Precision Microfabrication : 11-14 May, 2004, Nara, Japan. pp.454-457, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11. pp.998-1004, 1997. Pennington, NJ. Electrochemical Society
Magnesium-science, technology and applications : proceedings of the International Conference on Magnesium-Science, Technology and Applications September 20-24, 2004, Beijing, China. pp.449-452, 2005. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Fourth International Symposium on Laser Precision Microfabrication : 21-24 June, 2003, Munich, Germany. pp.189-192, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Image processing : algorithms and systems : 21-23 January 2002, San Jose, USA. pp.130-138, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Cisar, L. ; Yoshida, Y. ; Kamado, S. ; Kojima, Y. ; Watanabe, F.
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Magnesium alloys 2003 : proceedings of the Second Osaka International Conference on Platform Science and Technology for Advanced Magnesium Alloys 2003, Osaka, Japan, 26-30, January, 2003. pp.249-254, 2003. Zuerich, Switzerland. Trans Tech Publications
Huang, Z.W. ; Yoshida, Y. ; Cisar, L. ; Kamado, S. ; Kojima, Y.
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Magnesium alloys 2003 : proceedings of the Second Osaka International Conference on Platform Science and Technology for Advanced Magnesium Alloys 2003, Osaka, Japan, 26-30, January, 2003. pp.243-248, 2003. Zuerich, Switzerland. Trans Tech Publications
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Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.479-492, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nobukawa, T. ; Yoshida, Y. ; Kameoka, S. ; Ito, S. ; Tomishige, K. ; Kunimori, K.
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Recent advances in the science and technology of zeolites and related materials : proceedings of the 14th International Zeolite Conference, Cape Town, South Africa, 25-30th April 2004. pp.2514-2521, 2004. Amsterdam. Elsevier
Yang, Y.-Q. ; Nakamori, N. ; Yoshida, Y. ; Tsunoo, T. ; Endo, M. ; Sato, K.
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Medical Imaging 2002 : image processing : 24-28 February 2002, San Diego, USA. Part Two pp.1077-1084, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Saito, J. ; Mitani, M. ; Onda, M. ; Mohri, J. ; Ishii, S. ; Yoshida, Y. ; Furuyama, R. ; Nakano, T. ; Kashiwa, N. ; Fujita, T.
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Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002. pp.515-516, 2003. Amsterdam. Elsevier
Yoshida, Y. ; Matsui, S. ; Takagi, Y. ; Mitani, M. ; Saito, J. ; Ishii, S. ; Nakano, T. ; Tanaka, H. ; Kashiwa, N. ; Fujita, T.
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Science and technology in catalysis 2002 : proceedings of the Fourth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 14-19, 2002. pp.521-522, 2003. Amsterdam. Elsevier
Huang, Z. W. ; Yoshida, Y. ; Kamado, S. ; Kojima, Y.
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Magnesium-science, technology and applications : proceedings of the International Conference on Magnesium-Science, Technology and Applications September 20-24, 2004, Beijing, China. pp.593-596, 2005. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.479-492, 2003. Pennington, NJ. Electrochemical Society
Ito, Y. ; Iwata, M. ; Yoshida, Y. ; Takai, Y. ; Hirabayashi, I.
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Epitaxial oxide thin films III : symposium held March 31-April 2, 1997, San Francisco, California, U.S.A.. pp.125-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
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Coal liquefaction fundamentals : based on symposia sponsored by the Division of Fuel Chemistry at the ACS/CSJ Chemical Congress, Honolulu, Hawaii, April 2-5, 1979 and at the 178th meeting of the American Chemical Society, Washington, D.C., September 10-14, 1979. pp.315-, 1980. Washington, D.C.. American Chemical Society
Yoshida, Y. ; Cisar, L. ; Kamado, S. ; Koike, J. ; Kojima, Y.
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Magnesium alloys 2003 : proceedings of the Second Osaka International Conference on Platform Science and Technology for Advanced Magnesium Alloys 2003, Osaka, Japan, 26-30, January, 2003. pp.533-538, 2003. Zuerich, Switzerland. Trans Tech Publications
Nakamori, N. ; Yang, Y.-Q. ; Yoshida, Y. ; Tsunoo, T. ; Endo, M. ; Sato, K.
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Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA. pp.724-731, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.101-104, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yoshida, Y. ; Kashiwai, Y. ; Murakami, E. ; Ishida, S. ; Hashiguchi, N.
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Smart structures and materials 2002 : smart sensor technology and measurement systems : 18-19 March 2002, San Diego, USA. pp.296-303, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Mochimaru, M. ; Kouchi, M. ; Miyata, N. ; Tada, M. ; Yoshida, Y.
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2006 Digital Human Modeling for Design and Engineering Conference and Exposition : SAE technical paper. 2006. Warrendale, Penn.. Society of Automotive Engineers
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Society of Automotive Engineers technical paper series
Fifth International Symposium on Laser Precision Microfabrication : 11-14 May, 2004, Nara, Japan. pp.450-453, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Morikawa, Y. ; Sutou, T. ; Inazuki, Y. ; Adachi, T. ; Yoshida, Y. ; Kojima, K. ; Sasaki, S. ; Mohri, H. ; Hayashi, N. ; Dmitriev, V. ; Oshemkov, S. ; Zait, E. ; Ben-Zvi, G.
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Photomask and Next-Generation Lithography Mask Technology XIII. pp.62831Y-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Yoshida, Y. ; Amano, T. ; Sasaki, S. ; Itoh, K. ; Toyama, N. ; Mohri, H. ; Hayashi, N.
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Photomask and Next-Generation Lithography Mask Technology XIII. pp.62833G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Noguchi, K. ; Sasaki, S. ; Yoshida, Y. ; Adachi, T. ; Abe, T. ; Mohri, H. ; Kokubo, H. ; Morikawa, Y. ; Hayashi, N.
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Photomask and Next-Generation Lithography Mask Technology X. pp.407-414, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yoshida, Y. ; Sasaki, S. ; Abe, T. ; Mohri, H. ; Hayashi, N.
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Photomask and Next-Generation Lithography Mask Technology XI. pp.759-769, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering