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59 results

Conference Proceedings

1. LIGHT INDUCED CHANGE IN a-Si :H p-i-n SOLAR CELLS UNDER VARIOUS LIGHT SOAKING CONDITIONS

Sakai, H. ; Ihara, T. ; Nabeta, O. ; Yoshida, T. ; Maruyama, K. ; Ichikawa, Y. ; Uchida, Y.

Pub. info.:	Amorphous silicon semiconductors -- Pure and hydrogenated : symposium held April 21-24, 1987, Anaheim, California, U.S.A.. pp.589-594, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	95

Conference Proceedings

2. Magnetization Chirality of Ni-Fe and Ni-Fe/Mn-Ir Asymmetric Ring Dots for High-Density Memory Cells

Sasaki, I. ; Nakatani, R. ; Yoshida, T. ; Otaki, K. ; Endo, Y. ; Kawamura, Y. ; Yamamoto, M. ; Takenaga, T. ; Aya, S. ; Kuroiwa, T. ; Beysen, S. ; Kobayashi, H.

Pub. info.:	Advanced structural and functional materials design : proceedings of the International Symposium on Advanced Structural and Functional Materials Design, Osaka, Japan, November 10th-12th, 2004. pp.171-176, 2006. Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	512

Conference Proceedings

3. Characteristics of electric devices made by direct nanoparticle spraying

Ozawa, E. ; Kawakami, Y. ; Yoshida, T. ; Iwashina, M. ; Takahashi, K.

Pub. info.:	Third International Symposium on Laser Precision Microfabrication : proceedings : 27-31 May, 2002, Osaka, Japan. pp.232-237, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4830

Conference Proceedings

4. Effects of Ethanolamines on CdX (X = S, Se) Photoelectrochemistry

Minoura, H. ; Hibi, N. ; Sugieura, T. ; Yoshida, T. ; Kobayashi, H.

Pub. info.:	Proceedings of the Symposium on Photoelectrochemistry. pp.199-208, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-20

Conference Proceedings

5. A Study on Surface Morphology of Si Thin Film Grown by Temperature Modulation Molecular Layer Epitaxy Method

Nishizawa, J. ; Murai, A. ; Oizumi, T. ; Kuraboyashi, T. ; Kanamoto, K. ; Yoshida, T.

Pub. info.:	Fundamental gas-phase and surface chemistry of vapor-phase deposition II and process control, diagnostics, and modeling in semiconductor manufacturing IV : proceedings of the international symposium. pp.381-388, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-13

Conference Proceedings

6. Process Integration Trends for Embedded DRAM

Takato, H. ; Koike, H. ; Yoshida, T. ; Ishiuchi, H.

Pub. info.:	ULSI process integration : proceedings of the first international symposium. pp.107-122, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-18

Conference Proceedings

7. La0.5Sr0.5MnO3-YSZ composite film electrodes prepared by metal-organic decomposition for SOFC

Hayashi, K. ; Yoshida, T. ; Hosakawa, M. ; Ohya, Y. ; Takahashi, Y. ; Yamamoto, O. ; Minoura, Hideki

Pub. info.:	Proceedings of the Third International Symposium on Ionic and Mixed Conducting Ceramics. pp.700-707, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-24

Conference Proceedings

8. Chemical Bath Deposition of Band-Gap Tailored Indium Sulfide Thin Films

Yoshida, T. ; Yamaguchi, K. ; Toyoda, H. ; Akao, K. ; Sugiura, T. ; Minoura, H.

Pub. info.:	Proceedings of the Symposium on Photoelectrochemistry. pp.37-57, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-20

Conference Proceedings

9. AN ULTRASENSITIVE METHOD TO REVEAL DEFECTS THAT DEGRADE THE LOCALIZED RECOMBINATION LIFETIME OF THE NEAR SURFACE REGION OF BULK Si AND THIN EPILAYERS

Higgs, V. ; Chin, F. ; Wang, X. ; Kitagawara, Y. ; Yoshida, T.

Pub. info.:	Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.1564-1575, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-1(2)

10.

Conference Proceedings

10. C 66 Fullerene Encaging Sc 2 Dimer.

Wang, C.-R. ; Kai, I. ; Tomiyama, I. ; Yoshida, T. ; Kobayashi, V. ; Nishibori, E. ; Takata, M. ; Sakata, M. ; Shinohara, H.

Pub. info.:	Fullerenes 2000 : chemistry and physics of fullerenes and carbon nanomaterials, proceedings of the International Symposium. pp.336-341, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-12

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