Determining nanoscale physical properties of materials by microscopy and spectroscopy. pp.293-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.29-33, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Makino, H. ; Kim, J. J. ; Chen, P. P. ; Cho, M. W. ; Yao, T.
Pub. info.:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.11-16, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chen, P. P. ; Liu, G. J. ; Makino, H. ; Lu, W. ; Yao, T.
Pub. info.:
Fifth International Conference on Thin Film Physics and Applications : 31 May-2 June, 2004, Shanghai, China. pp.103-106, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yao, T. ; Okada, Y. ; Kawanami, H. ; Matsui, S. ; Imagawa, A. ; Ishida, K.
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Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A.. pp.63-68, 1987. Pittsburgh, Pa.. Materials Research Society
Yonenaga, I. ; Makino, H. ; Itoh, S. ; Goto, T. ; Yao, T.
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GaN, AIN, InN and their alloys : symposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A.. pp.335-342, 2005. Warrendale, Pa.. Materials Research Society
Jang, K. W. ; Oh, D. C. ; Minegishi, T. ; Suzuki, H. ; Hanada, T. ; Makino, H. ; Cho, M. W. ; Yao, T.
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Progress in compound semiconductor materials -- electronic and optoelectronic applications. pp.491-504, 2004. Warrendale, Pa.. Materials Research Society
Coal liquefaction fundamentals : based on symposia sponsored by the Division of Fuel Chemistry at the ACS/CSJ Chemical Congress, Honolulu, Hawaii, April 2-5, 1979 and at the 178th meeting of the American Chemical Society, Washington, D.C., September 10-14, 1979. pp.291-, 1980. Washington, D.C.. American Chemical Society
Kimura, K. ; Kajiyama, H. ; Miwa, S. ; Yasuda, T. ; Kuo, L. H. ; Jin, C. G. ; Tanaka, K. ; Yao, T.
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Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.51-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society