1.

Technical Paper
Technical Paper
1. Numerical and Experimental Investigations on a Variable Sonic Ejector
H. Namkoung ; C. Hong ; C. Moon ; K. Lee ; Y. Kim ; C. Kim
Pub. info.: AIAA meeting papers on disc.  2007.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2007
2.

Technical Paper
Technical Paper
2. Study on Heat Transfer Characteristics of Small Liquid Rocket Engine with Calorimeter
H. Namkoung ; P. Han ; K. Lee ; Y. Kim ; C. Kim ; Y. Yoon
Pub. info.: AIAA meeting papers on disc.  2006.  Reston, Va.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2006
3.

Conference Proceedings
Conference Proceedings
3. An explosive haze formation under low energy exposure
J. Lee ; Y. Kim ; Y. Choi ; C. Kim
Pub. info.: Photomask and next-generation lithography mask technology XV.  2  pp.70282B-1-70282B-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7028
4.

Conference Proceedings
Conference Proceedings
4. The study to optimize CD uniformity by reliable area CD measurement on 45nm D/R DRAM
Y. Choi ; S. Oh ; M. Kim ; Y. Kim ; C. Kim
Pub. info.: Photomask and next-generation lithography mask technology XV.  1  pp.70281O-1-70281O-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7028
5.

Conference Proceedings
Conference Proceedings
5. The source of carbon contamination for EUV mask production
Y. Kim ; J. Lee ; Y. Choi ; C. Kim
Pub. info.: Photomask and next-generation lithography mask technology XV.  2  pp.70281U-1-70281U-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7028
6.

Conference Proceedings
Conference Proceedings
6. EUV mask inspection tool using high NA DUV inspection tool
Y. Choi ; S. Oh ; M. Kim ; Y. Kim ; C. Kim
Pub. info.: Emerging lithographic technologies XII.  2  pp.692123-1-692123-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6921