Advanced biomedical and clinical diagnostic systems IV : 22-24 January 2006, San Jose, California, USA. pp.608018-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.60280I-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.603208-603208, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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He, L. ; Wu, Y. ; Chen, L. ; Yu, M.F. ; Wu, J. ; Yang, J.R. ; Li, Y.J. ; Ding, R.J. ; Zhang, Q.Y.
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Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA. pp.17-26, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina. pp.568-571, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Data mining and knowledge discovery : theory, tools, and technology V : 21-22 April, 2003, Orlando, Florida, USA. pp.147-154, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Nie, Y. ; Yan, H. ; Du, Y. ; Wu, Y. ; Yao, X. ; Shi, B.
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Optical design and testing II : 8-12 November 2004, Beijing, China. pp.1029-1036, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Color imaging IX : processing, hardcopy, and applications : 20-22 January 2004, San Jose, California, USA. pp.242-249, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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