1.

Conference Proceedings
Conference Proceedings
1. Defect States in SiC/GaN- and SiC/AlGaN/GaN-Heterostructures Characterized by Admittance and Photocurrent Spectroscopy
Witte, H. ; Krtschil, A. ; Lisker, M. ; Christen, J. ; Scholz, F. ; Off, J.
Pub. info.: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G3.71.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 537
2.

Conference Proceedings
Conference Proceedings
2. Electrical and Photoelectrical Characterization of Deep Defects in Cubic GaN on GaAs
Lisker, M. ; Krtschil, A. ; Witte, H. ; Christen, J. ; As, D. J. ; Schottker, B. ; Lischka, K.
Pub. info.: GaN and related alloys : symposium held November 30-December 4, 1998, Boston, Massachusetts, U.S.A..  pp.G3.14.1-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 537
3.

Conference Proceedings
Conference Proceedings
3. Deep Trap Characterization in GaN Using Thermal and Optical Admittance Spectroscopy
KrTschil, A. ; Witte, H. ; Lisker, M. ; Christen, J. ; Birkle, U. ; Einfeldt, S. ; Hommel, D. ; Topf, M. ; Meyer, B. K.
Pub. info.: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.887-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 482
4.

Conference Proceedings
Conference Proceedings
4. Enhancement of UV-Sensitivity in GaN/GaAs Heterostructures by Si-Doping
Lisker, M. ; Witte, H. ; Krtschil, A. ; Christen, J. ; As, D. J. ; Schottker, B. ; Lischka, K.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1591-1594,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)
5.

Conference Proceedings
Conference Proceedings
5. Fermi level pinning at GaN-interfaces: Correlation of electrical admittance and transient spectroscopy
Witte, H. ; Krtschil, A. ; Lisker, M. ; Rudloff, D. ; Christen, J. ; Krost, A. ; Stutzmann, M. ; Scholz, F.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.82.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595