1.

Conference Proceedings
Conference Proceedings
1. Deep Defects in Fe-Doped GaN Layers Analysed by Electrical and Photoelectrical Spectroscopic Methods
Witte, H. ; Fluegge, K. ; Dadgar, A. ; Krtschil, A. ; Krost, A. ; Christen, J
Pub. info.: GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.575-582,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 798
2.

Conference Proceedings
Conference Proceedings
2. Fermi level pinning at GaN-interfaces: Correlation of electrical admittance and transient spectroscopy
Witte, H. ; Krtschil, A. ; Lisker, M. ; Rudloff, D. ; Christen, J. ; Krost, A. ; Stutzmann, M. ; Scholz, F.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.82.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595