1.

Conference Proceedings
Conference Proceedings
1. Ion Beam Damage Processes in GaN *
Kncheyev, S.O. ; Williams, J.S. ; Zou, J. ; Jagadish, C. ; Bradby, J.E. ; Li, G.
Pub. info.: III-Nitride Based Semiconductor Electronics and Optical Devices and thirty-fourth State-of-the-Art-Program on Compound Semiconductors (SOTAPOCS XXXIV) : proceedings of the International Symposia.  pp.150-160,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-1
2.

Conference Proceedings
Conference Proceedings
2. Implant Isolation of ZnO Epitaxial Layers
Kucheyev, S.O. ; Jagadish, C. ; Williams, J.S. ; Deenapanray, P.N.K. ; Yano, Mitsuaki ; Koike, Kazuto ; Sasa, Shigehiko ; Inoue, Masataka ; Ogata, Ken-ichi
Pub. info.: Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.99-104,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 744
3.

Conference Proceedings
Conference Proceedings
3. Mechanical Properties of As-Grown and Ion-Beam-Modified GaN Films
Kucheyev, S.O. ; Bradby, J.E. ; Williams, J.S. ; Swain, M.V. ; Toth, M. ; Phillips, M.R. ; Jagadish, C.
Pub. info.: Fundamentals of nanoindentation and nanotribology II : symposium held November 28-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Penn..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 649
4.

Conference Proceedings
Conference Proceedings
4. Surface Disordering And Nitrogen Loss In GaN Under Ion Bombardment
Kucheyev, S.O. ; Williams, J.S. ; Jagadish, C. ; Zou, J. ; Toth, M. ; Phillips, M.R. ; Tan, H.H. ; Li, G. ; Pearton, S.J.
Pub. info.: Wide-bandgap electronic devices.  pp.T7.9-,  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 622