Blank Cover Image

Contact-free on-axis metrology for the fabrication and testing of complex optical systems [5965-36]

Author(s):
Publication title:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5965
Pub. Year:
2005
Page(from):
596510
Page(to):
596511
Pages:
2
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459831 [0819459836]
Language:
English
Call no.:
P63600/5965
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings On-axis, non-contact measurement of glass thicknesses and airgaps in optical systems with submicron accuracy

R. Wilhelm, A. Courteville, F. Garcia, F. de Vecchi

SPIE - The International Society of Optical Engineering
7 Conference Proceedings New optical fibre coating meant for embedding distributed sensors into concrete [5855-189]

Delepine-Lesoille, S., Merliot, E., Delaveau, M., Courteville, A., Quetel, L.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer [5856-41]

Wilhelm, R., Courteville, A., Garcia, F., FOGALE nanotech (France)

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Positioning of optical payload: SALT Telescope

Courteville, A., Garcia, F., Nel, L.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings A novel low-coherence fibre optic interferometer for position and thickness measurements with unattained accuracy [6341-62]

Courteville, A., Wilhelm, R., Garcia, F.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings New concept of low-intrusion quasi-distributed optical fibre extensometer [6189-20]

Courteville A., Delaveau M., Delepine-Lesoille S., Quetel L., Gautier Y., Dubroca S., Dumoulin J.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Optical phasing of a segmented mirror with subnanometer precision: experimental results of the APE Internal Metrology

R. Wilhelm, B. Luong, A. Courteville, S. Estival, F. Gonté

Society of Photo-optical Instrumentation Engineers
10 Conference Proceedings Absolute metrology for the Very Large Telescope Interferometer(VLTI)

Salvade,Y., Courteville,A., Dandliker,R.

SPIE - The International Society for Optical Engineering
5 Conference Proceedings Shape measurements of a segmented mirror with nanometer accuracy: the APE internal metrology [6267-86]

Wilhelm R., Courteville A., Estival S., Bietti A., Seiller V., Gonte F.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Off axis microspectrophotometer for optical coating characterization on complex surfaces [5965-67]

Niederwald, H., Deisenroth, L., Nunnendorf, S.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Positioning of optical payload, SALT telescope (Abstract Only)

Courteville, A., Garcia, F.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Optical design, manufacturing, and tests of the MUSE image slicer [5965-19]

Laurent, F., Renault, E., Bacon, R., Dubois, J. -P., Henault, F., Robert, D.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12