1.

Conference Proceedings
Conference Proceedings
1. ION MIXING AND DEMIXING IN THE Au-Si SYSTEM
Liu, B.-X. ; Wielunski, L. S. ; Nicolet, M.-A. ; Lau, S. S.
Pub. info.: Metastable materials formation by ion implantation : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.65-70,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 7
2.

Conference Proceedings
Conference Proceedings
2. EFFECT OF ION IRRADIATION ON THE FORMATION OF Ni, Cr AND Pt SILICIDE
Wielunski, L. S. ; Lien, C-D. ; Liu, B.-X. ; Nicolet, M. -A.
Pub. info.: Metastable materials formation by ion implantation : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.139-146,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 7
3.

Conference Proceedings
Conference Proceedings
3. FORMATION OF Au-Si METASTABLE PHASES BY ION MIXING
Liu, B. -X. ; Wielunski, L. S. ; Maenpaa, M. ; Nicolet, M.-A. ; Lau, S. S.
Pub. info.: Metastable materials formation by ion implantation : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.133-138,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 7
4.

Conference Proceedings
Conference Proceedings
4. DIFFUSION AND SUBSURFACE BONDING OF HYDROGEN IN SILICON
Jaworowski, A. E. ; Wielunski, L. S.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.305-312,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
5.

Conference Proceedings
Conference Proceedings
5. DIRECT MEASUREMENT OF THE SUBSURFACE HYDROGEN BARRIER LAYER IN PLASMA-TREATED SILICON RIBBON
Jaworowski, A. E. ; Wielunski, L. S. ; Listerman, T. W.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.561-566,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46